Nova Revolutionizes TSV Metrology With Innovative New System
Poster: SySAdmin
Posted on July 11, 2012 at 4:07:01 AM
Nova Revolutionizes TSV Metrology With Innovative New System
Introducing Nova V2600[TM]with Dark-Field Reflectometry for Full TSV Profile Control
REHOVOT, Israel, July 11, 2012/PRNewswire-FirstCall/ --
Novel technology brings the profiling power of Optical CD to TSV metrology; Enables
the move to production of 3D integration with robust high-throughput control of TSV
formation processes
Nova Measuring Instruments Ltd. (NASDAQ: NVMI), a leading provider of optical
metrology solutions to the semiconductor process control market, today announced a
technological breakthrough that will enable chipmakers to accelerate the development and
improve production yield of multi-chip integrations that rely on TSVs (Through Silicon
Vias). The powerful new Nova V2600 TSV Metrology system, developed in collaboration with
leading device makers, allows for the first time accurate measurement of critical TSV
features such as side-wall angle, bottom diameter, and bottom curvature. This much-awaited
process control solution delivers complete TSV dimensional metrology in a high-throughput
production-ready system for the industry's transition to 3D integration in production.
Several new technologies were developed by Nova for this complex application, breaking
the barrier that previously precluded the use of Optical CD methodology on non-periodic
structures. Using a special optical configuration (patent pending), Nova V2600 collects a
dark-field reflectometry spectrum that is highly sensitive to variations in TSV internal
structures. An innovative and unique modeling engine, proven to enable the translation of
this spectrum into accurate via dimensions through spectral fitting, has been developed.
Unlike competing technologies that rely on resolution-limited optical imaging, this
spectral method can be extended to future TSVs with diameters below 5 microns.
"We are excited to make our entry into the 3D integration market with a truly
differentiated metrology product. It is very satisfying to introduce game-changing
innovation into an emerging market segment that is looking for the right solution", said
Gabi Seligsohn, President and CEO of Nova. "Customers response to the technology,
performance, and productivity of the Nova V2600 has been outstanding, and we expect
multiple orders from leading chipmakers to be finalized in the near future, following a
rigorous selection process".
Nova V2600 fits into the production-proven Nova Modular Metrology[TM] platform that
accommodates two metrology units on a single compact frame. This high-throughput platform
is recognized for providing superior cost of ownership and operational flexibility. For
more information please visit: http://www.nova.co.il.
About Nova: Nova Measuring Instruments Ltd. develops, produces and markets advanced
integrated and stand alone metrology solutions for the semiconductor manufacturing
industry. Nova is traded on the NASDAQ & TASE under the symbol NVMI. The Company's website
is http://www.nova.co.il.
This press release contains forward-looking statements within the meaning of safe
harbor provisions of the Private Securities Litigation Reform Act of 1995 relating to
future events or our future performance, such as statements regarding trends, demand for
our products, expected deliveries, transaction, expected revenues, operating results,
earnings and profitability. Forward-looking statements involve known and unknown risks,
uncertainties and other factors that may cause our actual results, levels of activity,
performance or achievements to be materially different from any future results, levels of
activity, performance or achievements expressed or implied in those forward looking
statements. These risks and other factors include but are not limited to: our dependency
on two product lines; the highly cyclical nature of the markets we target; our inability
to reduce spending during a slowdown in the semiconductor industry; our ability to respond
effectively on a timely basis to rapid technological changes; our dependency on OEM
suppliers; cyber security risks; risks related to open source technologies; our ability to
retain our competitive position despite the ongoing consolidation in our industry; risks
associated with our dependence on a single manufacturing facility; our ability to expand
our manufacturing capacity or marketing efforts to support our future growth; our
dependency on a small number of large customers and small number of suppliers; our
dependency on our key employees; risks related to changes in our order backlog; risks
related to the financial, political and environmental instabilities that may affect our
sales in Asia; risks related to our intellectual property; changes in customer demands for
our products; new product offerings from our competitors; changes in or an inability to
execute our business strategy; unanticipated manufacturing or supply problems; changes in
tax requirements; changes in customer demand for our products; risks related to currency
fluctuations and risks related to our operations in Israel. We cannot guarantee future
results, levels of activity, performance or achievements. The matters discussed in this
press release also involve risks and uncertainties summarized under the heading "Risk
Factors" in Nova's Annual Report on Form 20-F for the year ended December 31, 2011 filed
with the Securities and Exchange Commission on March 28, 2012. These factors are updated
from time to time through the filing of reports and registration statements with the
Securities and Exchange Commission. Nova Measuring Instruments Ltd. does not assume any
obligation to update the forward-looking information contained in this press release.
Company Contact:
Dror David, Chief Financial Officer
Nova Measuring Instruments Ltd.
Tel: +972-73-229-5833
E-mail: info@nova.co.il
http://www.nova.co.il
Investor Relations Contacts:
Ehud Helft / Kenny Green
GCCG Investor Relations
Tel: +1-646-201-9246
E-mail: nova@ccgisrael.com
Source: Nova Measuring Instruments Ltd
Introducing Nova V2600[TM]with Dark-Field Reflectometry for Full TSV Profile Control
REHOVOT, Israel, July 11, 2012/PRNewswire-FirstCall/ --
Novel technology brings the profiling power of Optical CD to TSV metrology; Enables
the move to production of 3D integration with robust high-throughput control of TSV
formation processes
Nova Measuring Instruments Ltd. (NASDAQ: NVMI), a leading provider of optical
metrology solutions to the semiconductor process control market, today announced a
technological breakthrough that will enable chipmakers to accelerate the development and
improve production yield of multi-chip integrations that rely on TSVs (Through Silicon
Vias). The powerful new Nova V2600 TSV Metrology system, developed in collaboration with
leading device makers, allows for the first time accurate measurement of critical TSV
features such as side-wall angle, bottom diameter, and bottom curvature. This much-awaited
process control solution delivers complete TSV dimensional metrology in a high-throughput
production-ready system for the industry's transition to 3D integration in production.
Several new technologies were developed by Nova for this complex application, breaking
the barrier that previously precluded the use of Optical CD methodology on non-periodic
structures. Using a special optical configuration (patent pending), Nova V2600 collects a
dark-field reflectometry spectrum that is highly sensitive to variations in TSV internal
structures. An innovative and unique modeling engine, proven to enable the translation of
this spectrum into accurate via dimensions through spectral fitting, has been developed.
Unlike competing technologies that rely on resolution-limited optical imaging, this
spectral method can be extended to future TSVs with diameters below 5 microns.
"We are excited to make our entry into the 3D integration market with a truly
differentiated metrology product. It is very satisfying to introduce game-changing
innovation into an emerging market segment that is looking for the right solution", said
Gabi Seligsohn, President and CEO of Nova. "Customers response to the technology,
performance, and productivity of the Nova V2600 has been outstanding, and we expect
multiple orders from leading chipmakers to be finalized in the near future, following a
rigorous selection process".
Nova V2600 fits into the production-proven Nova Modular Metrology[TM] platform that
accommodates two metrology units on a single compact frame. This high-throughput platform
is recognized for providing superior cost of ownership and operational flexibility. For
more information please visit: http://www.nova.co.il.
About Nova: Nova Measuring Instruments Ltd. develops, produces and markets advanced
integrated and stand alone metrology solutions for the semiconductor manufacturing
industry. Nova is traded on the NASDAQ & TASE under the symbol NVMI. The Company's website
is http://www.nova.co.il.
This press release contains forward-looking statements within the meaning of safe
harbor provisions of the Private Securities Litigation Reform Act of 1995 relating to
future events or our future performance, such as statements regarding trends, demand for
our products, expected deliveries, transaction, expected revenues, operating results,
earnings and profitability. Forward-looking statements involve known and unknown risks,
uncertainties and other factors that may cause our actual results, levels of activity,
performance or achievements to be materially different from any future results, levels of
activity, performance or achievements expressed or implied in those forward looking
statements. These risks and other factors include but are not limited to: our dependency
on two product lines; the highly cyclical nature of the markets we target; our inability
to reduce spending during a slowdown in the semiconductor industry; our ability to respond
effectively on a timely basis to rapid technological changes; our dependency on OEM
suppliers; cyber security risks; risks related to open source technologies; our ability to
retain our competitive position despite the ongoing consolidation in our industry; risks
associated with our dependence on a single manufacturing facility; our ability to expand
our manufacturing capacity or marketing efforts to support our future growth; our
dependency on a small number of large customers and small number of suppliers; our
dependency on our key employees; risks related to changes in our order backlog; risks
related to the financial, political and environmental instabilities that may affect our
sales in Asia; risks related to our intellectual property; changes in customer demands for
our products; new product offerings from our competitors; changes in or an inability to
execute our business strategy; unanticipated manufacturing or supply problems; changes in
tax requirements; changes in customer demand for our products; risks related to currency
fluctuations and risks related to our operations in Israel. We cannot guarantee future
results, levels of activity, performance or achievements. The matters discussed in this
press release also involve risks and uncertainties summarized under the heading "Risk
Factors" in Nova's Annual Report on Form 20-F for the year ended December 31, 2011 filed
with the Securities and Exchange Commission on March 28, 2012. These factors are updated
from time to time through the filing of reports and registration statements with the
Securities and Exchange Commission. Nova Measuring Instruments Ltd. does not assume any
obligation to update the forward-looking information contained in this press release.
Company Contact:
Dror David, Chief Financial Officer
Nova Measuring Instruments Ltd.
Tel: +972-73-229-5833
E-mail: info@nova.co.il
http://www.nova.co.il
Investor Relations Contacts:
Ehud Helft / Kenny Green
GCCG Investor Relations
Tel: +1-646-201-9246
E-mail: nova@ccgisrael.com
Source: Nova Measuring Instruments Ltd